BS EN 62386-206-2009 数字可寻址照明接口.控制装置用详细要求.数字信号转换为直流电压信号(装置类型5)
时间:2024-05-13 12:43:16 来源: 标准资料网 作者：标准资料网 阅读：8653
【英文标准名称】:Digitaladdressablelightinginterface-Particularrequirementsforcontrolgear-Conversionfromdigitalsignalintod.c.voltage(devicetype5)
【原文标准名称】:数字可寻址照明接口.控制装置用详细要求.数字信号转换为直流电压信号(装置类型5)
【标准号】:BSEN62386-206-2009
【标准状态】:现行
【国别】:英国
【发布日期】:2010-01-31
【实施或试行日期】:2010-01-31
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:附件;地址(数据处理);寻址;交流电流;交流电压;交流电设备;放电灯附属器具;镇流器;电路;控制装置;电流;数字的;数字信号;尺寸;直流电流;直流电压;放电灯;耐久性;电器;电灯;电气工程;电磁学;电子工程;电驱动装置;EMC;故障;荧光;荧光灯;卤素灯;照明工程;信息;检验;接口;接口(数据处理);电气连接件用接口;灯;照明设备;作标记;测量;测量技术;操作;协议;合格试验;安全;安全要求;规范(验收);开关设备;起飞;试验序列;试验;试验条件;管式荧光灯;管形灯;管状
【英文主题词】:Accessories;Addresses(dataprocessing);Addressing;Alternatingcurrent;Alternatingvoltages;Alternating-currentappliances;Auxiliariesfordischargelamps;Ballasts;Circuits;Controldevices;Currents;Digital;Digitalsignals;Dimensions;Directcurrent;Directvoltage;Dischargelamps;Durability;Electricappliances;Electriccurrent;Electriclamps;Electricalengineering;Electromagnetism;Electronicengineering;Electronically-operateddevices;EMC;Failure;Fluorescence;Fluorescentlamps;Halogenlamps;Illuminationengineering;Information;Inspection;Interfaces;Interfaces(dataprocessing);Interfacesofelectricalconnections;Lamps;Lightingsystems;Marking;Measurement;Measuringtechniques;Operation;Protocols;Qualificationtests;Safety;Safetyrequirements;Specification(approval);Switchgear;Take-off;Testsequences;Testing;Testingconditions;Tubularfluorescentlamps;Tubularlamps;Tubularshape
【摘要】:ThisInternationalStandardspecifiesaprotocolandtestmethodsforthecontrolbydigitalsignalsofelectroniccontrolgear,associatedwiththeconversionfromdigitalsignalintod.c.voltage.
【中国标准分类号】:K70
【国际标准分类号】:
【页数】:28P.;A4
【正文语种】:英语
【英文标准名称】:Semiconductordevices-Part1:General;Corrigendum1
【原文标准名称】:半导体装置.第1部分:总则.技术勘误1
【标准号】:IEC60747-1Corrigendum1-2008
【标准状态】:现行
【国别】:国际
【发布日期】:2008-09
【实施或试行日期】:
【发布单位】:国际电工委员会(IX-IEC)
【起草单位】:IEC/TC47
【标准类型】:()
【标准水平】:()
【中文主题词】:色码;元部件;连接件;分立器件;电气工程;电子工程;电子设备及元件;图形符号;操作;检验;集成电路;布置;寿命;极限(数学);作标记;标记;测量;测量技术;评定;基准方法;可靠性;半导体器件;半导体;标志;规范(验收);符号;测试;警告符号
【英文主题词】:Colourcodes;Components;Connections;Discretedevices;Electricalengineering;Electronicengineering;Electronicequipmentandcomponents;Graphicsymbols;Handling;Inspection;Integratedcircuits;Layout;Life(durability);Limits(mathematics);Marking;Marks;Measurement;Measuringtechniques;Ratings;Referencemethods;Reliability;Semiconductordevices;Semiconductors;Signs;Specification(approval);Symbols;Testing;Warningsymbols
【摘要】:
【中国标准分类号】:L40
【国际标准分类号】:31_200
【页数】:4P;A4
【正文语种】:英语
Product Code:SAE AS4115
Title:Test Plan for the Digital Time Division Command/Response Multiplex Data Bus System
Issuing Committee:As-1a Avionic Networks Committee
Scope: This test plan consists of two major sections for testing of MIL-STD-1553B data bus systems: Bus Network and System Integration Tests. This test plan defines the test requirements for: a) verifying that the bus network, (that is, cabling, couplers, connectors and terminators) when in the final system design configuration, complies with the requirements of MIL-STD-1553B and b) ensuring that when the bus system (that is, bus network, remote terminals and bus controllers) is integrated, it meets the specific requirements of MIL-STD-1553B, and provides for reliable communications within its system environment.